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手順3
After pre-processing the chips are examined. It's best to see that your specimen is ready... ...ready for the transmission electron microscope (TEM).
  • After pre-processing the chips are examined. It's best to see that your specimen is ready...

  • ...ready for the transmission electron microscope (TEM).

  • This bad boy is handy when you want to know transistor strain, gate oxide thicknesses, or crystal lattice orientation.

  • Like the ion blaster, the TEM uses the shoot-first-ask-questions-later method by blasting electrons at its prey to see just what they're made of.

  • We've had fun taking a tiny peek at Chipworks's playground, but we've got to move on before the anticipatory drool leads to a series of keyboard replacements.

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