手順 3を翻訳中
手順3

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After pre-processing the chips are examined. It's best to see that your specimen is ready...
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...ready for the transmission electron microscope (TEM).
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This bad boy is handy when you want to know transistor strain, gate oxide thicknesses, or crystal lattice orientation.
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Like the ion blaster, the TEM uses the shoot-first-ask-questions-later method by blasting electrons at its prey to see just what they're made of.
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We've had fun taking a tiny peek at Chipworks's playground, but we've got to move on before the anticipatory drool leads to a series of keyboard replacements.
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