メインコンテンツにスキップ

修理を始めるには

修理する権利

パーツ&ツール

手順3に変更

Brittany McCriglerさんによる編集

承認済みの編集 : Brittany McCrigler

変更なし

手順ライン

[* black] After pre-processing the chips are examined. It's best to see that your specimen is ready...
[* black] ...ready for the transmission electron microscope (TEM).
[* black] This bad boy is handy when you want to know transistor strain, gate oxide thicknesses, or crystal lattice orientation.
[* black] Like the ion blaster, the TEM uses the shoot-first-ask-questions-later method by blasting electrons at its prey to see how they get along.
[* black] We've had fun taking a tiny peek at Chipworks playground, but we've got to move on before the drool requires a series of keyboard replacements.