メインコンテンツにスキップ

手順6に変更

Brett Harttさんによる編集

承認済みの編集 : Brett Hartt

変更なし

手順ライン

-[* black] Depending on what we are trying to learn in our analysis, different tools are required. When we are trying to examine transistor strain engineering, gate oxide thicknesses, or crystal lattice orientations, we go to the big gun...the electron gun that's in our new [http://bit.ly/bpKJ4|TEM (Transmission Electron Microscope)].
+[* black] Different tasks call for different tools. If you want to look at some [http://en.wikipedia.org/wiki/Strain_engineering|transistor strain], or some [http://en.wikipedia.org/wiki/Threshold_voltage|gate oxide thicknesses], or even [http://en.wikipedia.org/wiki/Crystal_structure|crystal lattice] orientation, you go for the big gun…
+[* black] …the electron gun that's in the new [http://bit.ly/bpKJ4|TEM (Transmission Electron Microscope)]!
+ [* black] To make a long story short, TEM works by shooting a bunch of electrons at a piece of material, then watching the way the electrons interact with that material.